Bringing Scanning Probe Microscopy up to Speed

Bringing Scanning Probe Microscopy up to Speed

Author: Stephen C. Minne

Publisher: Springer Science & Business Media

ISBN: 9781461551676

Category: Technology & Engineering

Page: 159

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Bringing Scanning Probe Microscopy Up to Speed introduces the principles of scanning probe systems with particular emphasis on techniques for increasing speed. The authors include useful information on the characteristics and limitations of current state-of-the-art machines as well as the properties of the systems that will follow in the future. The basic approach is two-fold. First, fast scanning systems for single probes are treated and, second, systems with multiple probes operating in parallel are presented. The key components of the SPM are the mechanical microcantilever with integrated tip and the systems used to measure its deflection. In essence, the entire apparatus is devoted to moving the tip over a surface with a well-controlled force. The mechanical response of the actuator that governs the force is of the utmost importance since it determines the scanning speed. The mechanical response relates directly to the size of the actuator; smaller is faster. Traditional scanning probe microscopes rely on piezoelectric tubes of centimeter size to move the probe. In future scanning probe systems, the large actuators will be replaced with cantilevers where the actuators are integrated on the beam. These will be combined in arrays of multiple cantilevers with MEMS as the key technology for the fabrication process.
Bringing Scanning Probe Microscopy up to Speed
Language: en
Pages: 159
Authors: Stephen C. Minne, Scott R. Manalis, Calvin F. Quate
Categories: Technology & Engineering
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media

Bringing Scanning Probe Microscopy Up to Speed introduces the principles of scanning probe systems with particular emphasis on techniques for increasing speed. The authors include useful information on the characteristics and limitations of current state-of-the-art machines as well as the properties of the systems that will follow in the future.
Bringing Scanning Probe Microscopy up to Speed
Language: en
Pages: 180
Authors: Stephen C. Minne, Scott R. Manalis, Calvin F. Quate
Categories: Technology & Engineering
Type: BOOK - Published: 1999-02-28 - Publisher: Springer Science & Business Media

Bringing Scanning Probe Microscopy Up to Speed introduces the principles of scanning probe systems with particular emphasis on techniques for increasing speed. The authors include useful information on the characteristics and limitations of current state-of-the-art machines as well as the properties of the systems that will follow in the future.
Applied Scanning Probe Methods V
Language: en
Pages: 344
Authors: Bharat Bhushan, Harald Fuchs, Satoshi Kawata
Categories: Technology & Engineering
Type: BOOK - Published: 2006-11-04 - Publisher: Springer Science & Business Media

The volumes V, VI and VII will examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a timely comprehensive overview of SPM applications. This is the first book summarizing the state-of-the-art of this technique. The chapters are written by leading researchers and
Nanoscience
Language: en
Pages: 823
Authors: Claire Dupas, Marcel Lahmani
Categories: Science
Type: BOOK - Published: 2007-02-13 - Publisher: Springer Science & Business Media

This practically-oriented overview of nanotechnologies and nanosciences is designed to provide students and researchers with essential information on both the tools of manufacture and specific features of the nanometric scale. Specific applications and techniques covered include nanolithography, STM and AFM, nanowires and supramolecules, molecular electronics, pptronics, and simulation. Each section
Atomic Force Microscopy for Biologists
Language: en
Pages: 420
Authors: Victor J Morris, Andrew R Kirby, A Patrick Gunning
Categories: Science
Type: BOOK - Published: 2009-08-11 - Publisher: World Scientific

Atomic force microscopy (AFM) is part of a range of emerging microscopic methods for biologists which offer the magnification range of both the light and electron microscope, but allow imaging under the "natural" conditions usually associated with the light microscope. To biologists, AFM offers the prospect of high resolution images