Introduction to IDDQ Testing

Introduction to IDDQ Testing

Author: S. Chakravarty

Publisher: Springer Science & Business Media

ISBN: 9781461561378

Category: Technology & Engineering

Page: 323

View: 274

Download Now
Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs. If, for one or more inputs, there is a discrepancy between the observed output and the expected output then the IC is declared to be defective. A new approach to testing digital circuits, which has come to be known as IDDQ testing, has been actively researched for the last fifteen years. In IDDQ testing, the steady state supply current, rather than the logic levels at the primary outputs, is monitored. Years of research suggests that IDDQ testing can significantly improve the quality and reliability of fabricated circuits. This has prompted many semiconductor manufacturers to adopt this testing technique, among them Philips Semiconductors, Ford Microelectronics, Intel, Texas Instruments, LSI Logic, Hewlett-Packard, SUN microsystems, Alcatel, and SGS Thomson. This increase in the use of IDDQ testing should be of interest to three groups of individuals associated with the IC business: Product Managers and Test Engineers, CAD Tool Vendors and Circuit Designers. Introduction to IDDQ Testing is designed to educate this community. The authors have summarized in one volume the main findings of more than fifteen years of research in this area.
Introduction to IDDQ Testing
Language: en
Pages: 323
Authors: S. Chakravarty, Paul J. Thadikaran
Categories: Technology & Engineering
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media

Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs. If, for one or more inputs, there is a discrepancy between the observed output
Introduction to IDDQ Testing
Language: en
Pages: 323
Authors: S. Chakravarty, Paul J. Thadikaran
Categories: Technology & Engineering
Type: BOOK - Published: 2012-10-12 - Publisher: Springer

Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs. If, for one or more inputs, there is a discrepancy between the observed output
IDDQ Testing of VLSI Circuits
Language: en
Pages: 124
Authors: Ravi K. Gulati, Charles F. Hawkins
Categories: Computers
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media

Power supply current monitoring to detect CMOS IC defects during production testing quietly laid down its roots in the mid-1970s. Both Sandia Labs and RCA in the United States and Philips Labs in the Netherlands practiced this procedure on their CMOS ICs. At that time, this practice stemmed simply from
Introduction to IDDQ Testing
Language: en
Pages: 352
Authors: S. Chakravarty, Paul J. Thadikaran
Categories: Computers
Type: BOOK - Published: 1997-06-30 - Publisher: Boom Koninklijke Uitgevers

A new approach to testing digital circuits, which has come to be known as I[subscript DDQ] testing, has been actively researched for the last fifteen years. In I[subscript DDQ] testing, the steady state supply current, rather than the logic levels at the primary outputs, is monitored. Years of research suggests
Introduction to Microelectronics to Nanoelectronics
Language: en
Pages: 350
Authors: Manoj Kumar Majumder, Vijay Rao Kumbhare, Aditya Japa, Brajesh Kumar Kaushik
Categories: Science
Type: BOOK - Published: 2020-11-25 - Publisher: CRC Press

Focussing on micro- and nanoelectronics design and technology, this book provides thorough analysis and demonstration, starting from semiconductor devices to VLSI fabrication, designing (analog and digital), on-chip interconnect modeling culminating with emerging non-silicon/ nano devices. It gives detailed description of both theoretical as well as industry standard HSPICE, Verilog, Cadence