Particle Characterization: Light Scattering Methods

Particle Characterization: Light Scattering Methods

Author: Renliang Xu

Publisher: Springer Science & Business Media

ISBN: 9780306471247

Category: Science

Page: 399

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Particle characterization is an important component in product research and development, manufacture, and quality control of particulate materials and an important tool in the frontier of sciences, such as in biotechnology and nanotechnology. This book systematically describes one major branch of modern particle characterization technology - the light scattering methods. This is the first monograph in particle science and technology covering the principles, instrumentation, data interpretation, applications, and latest experimental development in laser diffraction, optical particle counting, photon correlation spectroscopy, and electrophoretic light scattering. In addition, a summary of all major particle sizing and other characterization methods, basic statistics and sample preparation techniques used in particle characterization, as well as almost 500 latest references are provided. The book is a must for industrial users of light scattering techniques characterizing a variety of particulate systems and for undergraduate or graduate students who want to learn how to use light scattering to study particular materials, in chemical engineering, material sciences, physical chemistry and other related fields.
Particle Characterization: Light Scattering Methods
Language: en
Pages: 399
Authors: Renliang Xu
Categories: Science
Type: BOOK - Published: 2006-04-11 - Publisher: Springer Science & Business Media

Particle characterization is an important component in product research and development, manufacture, and quality control of particulate materials and an important tool in the frontier of sciences, such as in biotechnology and nanotechnology. This book systematically describes one major branch of modern particle characterization technology - the light scattering methods.
Measurement Technology and Intelligent Instruments IX
Language: en
Pages: 664
Authors: Yuri V. Chugui, Yongsheng Gao, Kuang-Chao Fan, Roald Taymanov, Ksenia Sapozhnikova
Categories: Technology & Engineering
Type: BOOK - Published: 2010-05-20 - Publisher: Trans Tech Publications Ltd

This special collection focuses on measurement science and metrology: micro- and nano- measurements; novel measurement methods and diagnostic technologies, including non-destructive and dimensional inspection, optical and X-ray tomography and interferometry, terahertz technologies for science, industry and biomedicine, intelligent measuring instruments and systems for industry and transport, measurements of geometrical and
Particle Size Analysis
Language: en
Pages: 558
Authors: N G Stanley-Wood, R W Lines
Categories: Science
Type: BOOK - Published: 2007-10-31 - Publisher: Royal Society of Chemistry

Particle Size Analysis reviews the development of particle characterization over the past 25 years and also speculates on its future. Interest in the subject has increased enormously over the years and this book highlights the changes and advances made within the field. This book is comprehensive in its coverage of
Particle Systems Characterization by Inversion of Critical Light Scattering Patterns
Language: en
Pages: 181
Authors: Mariusz Krzysiek (Andrzej)
Categories: Science
Type: BOOK - Published: 2009 - Publisher:

This Ph. D. work deals with the scattering of light by a cloud of bubbles (i.e. particles with relative refractive index below unit) near the critical-scattering-angle. Under a single scattering assumption, a critical scattering pattern (CSP) can be accurately modeled with the Lorenz-Mie theory and a Fredholm integral of the
Inversion of Critical Light Scattering
Language: en
Pages: 196
Authors: Mariusz Krzysiek
Categories: Science
Type: BOOK - Published: 2010-08 - Publisher: Omniscriptum

This Ph.D. work deals with the scattering of light by a cloud of bubbles (i.e. particles with relative refractive index below unit) near the critical-scattering-angle. Under a single scattering assumption, a critical scattering pattern (CSP) can be accurately modeled with the Lorenz-Mie theory and a Fredholm integral of the first